An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.
If this is your thesis or dissertation, and want to learn how to access it or for more information about readership statistics, contact us at STARS@ucf.edu
Master of Science in Aerospace Engineering (M.S.A.E.)
College of Engineering and Computer Science
Mechanical and Aerospace Engineering
Aerospace Engineering; Thermofluid Aerodynamic Systems
Length of Campus-only Access
Masters Thesis (Campus-only Access)
Arends-Rodriguez, Armando, "Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements" (2017). Electronic Theses and Dissertations. 5440.