Abstract

An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.

Graduation Date

2017

Semester

Spring

Advisor

Putnam, Shawn

Degree

Master of Science in Aerospace Engineering (M.S.A.E.)

College

College of Engineering and Computer Science

Department

Mechanical and Aerospace Engineering

Degree Program

Aerospace Engineering; Thermofluid Aerodynamic Systems

Format

application/pdf

Identifier

CFE0006559

URL

http://purl.fcla.edu/fcla/etd/CFE0006559

Language

English

Release Date

May 2018

Length of Campus-only Access

1 year

Access Status

Masters Thesis (Campus-only Access)

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