Near-Infrared Raman-Spectroscopy Using Ccd Detection And A Semiconductor Bandgap Filter For Rayleigh Line Rejection
Title - Alternative
Instrumentation, Ccd; Lasers, Ti Sapphire; Raman Spectroscopy; Instruments & Instrumentation; Spectroscopy
A novel application of a tuneable Ti:sapphire laser and a CdTe Rayleigh line rejection filter for near-infrared Raman spectroscopy employing a single grating spectrograph and multichannel detection is demonstrated. Raman spectra of liquid, solid, and photobiological samples have been measured within 75 cm-1 of the exciting laser line. At excitation wavelengths between 790 and 850 nm, a significant improvement in sensitivity over that for present Fourier transform Raman techniques has been obtained.
Schulte, A., "Near-Infrared Raman-Spectroscopy Using Ccd Detection And A Semiconductor Bandgap Filter For Rayleigh Line Rejection" (1992). Faculty Bibliography. 1458.