Critical-Field Patterns In Optical Fibonacci Multilayers
Title - Alternative
J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
Acoustic-Waves; Localization; Dense; Light; Optics
Optical coatings with 13, 34, 55, and 89 quarter-wave layers of high- and low-index dielectric materials arranged in Fibonacci sequences F6, F8, F9, and F10, respectively, were deposited with use of a reactive low-voltage ion plating process. The calculated average transmission (T(ave)) for phi = (1/2 +/- 1/4)pi follows a power law T(ave) almost-equal-to N(m)-delta, where N(m) is the number of optical quarter-wave layers in a Fibonacci sequence F(m). The critical exponent delta for these multilayers is compared with a renormalization calculation of the exponent governing the total energy width for an electronic system of Fibonacci layers. Spectral-transmittance measurements of the experimental Fibonacci multilayers show some deviation from the calculated spectral transmittance, which is due primarily to absorption in the short-wavelength range, but these measurements do still indicate that the observed optical field patterns are critical.
Journal of the Optical Society of America a-Optics Image Science and Vision
Chow, L. and Guenther, K. H., "Critical-Field Patterns In Optical Fibonacci Multilayers" (1993). Faculty Bibliography. 1484.