Title

Near Threshold 4D Photoexcitation And Photoionization Of Xe

Title - Alternative

J. Phys. B-At. Mol. Opt. Phys.

Keywords

Angular-Distribution; Electron-Spectroscopy; Core Resonances; Shake; Processes; Ionized Xenon; Auger; Decay; Shell; Kr; Autoionization; Optics; Physics, Atomic, Molecular & Chemical

Abstract

The angular distribution parameter beta of the N5-O2,3O2,3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter alpha2 for each of the N5-O2,3O2,3 Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of beta and alpha2 for the N5-O2,3O2,3 Auger lines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff.

Publication Title

Journal of Physics B-Atomic Molecular and Optical Physics

Volume

25

Issue/Number

22

Publication Date

1-1-1992

Document Type

Article

Language

English

First Page

4755

Last Page

4771

WOS Identifier

WOS:A1992KA75000012

ISSN

0953-4075

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