Near Threshold 4D Photoexcitation And Photoionization Of Xe
Title - Alternative
J. Phys. B-At. Mol. Opt. Phys.
Angular-Distribution; Electron-Spectroscopy; Core Resonances; Shake; Processes; Ionized Xenon; Auger; Decay; Shell; Kr; Autoionization; Optics; Physics, Atomic, Molecular & Chemical
The angular distribution parameter beta of the N5-O2,3O2,3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter alpha2 for each of the N5-O2,3O2,3 Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of beta and alpha2 for the N5-O2,3O2,3 Auger lines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff.
Journal of Physics B-Atomic Molecular and Optical Physics
Whitfield, S. B.; Caldwell, C. D.; Huang, D. X.; and Krause, M. O., "Near Threshold 4D Photoexcitation And Photoionization Of Xe" (1992). Faculty Bibliography. 1580.