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Keywords

Optics; Physics; Atomic; Molecular & Chemical

Abstract

Photoionization cross sections (σ) and photoelectron angular distribution parameters (β) across the (ns’,nd’) autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 Å by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns’ resonances.

Journal Title

Physical Review A

Volume

42

Issue/Number

3

Publication Date

1-1-1990

Document Type

Article

Language

English

First Page

1350

Last Page

1357

WOS Identifier

WOS:A1990DT51300039

ISSN

1050-2947

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