Title

Extreme Value Statistics in Silicon Photonics

Authors

Authors

D. Borlaug; S. Fathpour;B. Jalali

Comments

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Abstract

L-shape probability distributions are extremely non-Gaussian functions that have been surprisingly successful in describing the occurrence of extreme events ranging from stock market crashes, natural disasters, structure of biological systems, fractals, and optical rogue waves. We show that fluctuations in stimulated Raman scattering, as well as in coherent anti-Stokes Raman scattering, in silicon can follow extreme value statistics and provide mathematical insight into the origin of this behavior.

Journal Title

Ieee Photonics Journal

Volume

1

Issue/Number

1

Publication Date

1-1-2009

Document Type

Article

First Page

33

Last Page

39

WOS Identifier

WOS:000281635000004

ISSN

1943-0655

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