Title

Demonstration of Pinhole Laser Beam Profiling Using a Digital Micromirror Device

Authors

Authors

M. Sheikh;N. A. Riza

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

IEEE Photonics Technol. Lett.

Keywords

Digital micromirror device (DMD); laser beam profiler; laser; measurements; pinhole profiler; Engineering, Electrical & Electronic; Optics; Physics, Applied

Abstract

Demonstrated for the first time, to the best of the authors' knowledge, is two-dimensional (2-D) pinhole laser beam profiling using a Texas Instruments visible band digital micromirror device (DMD). Software controlled micromirror digital tilt positions across the DMD plane create a moving pinhole for sampling an arbitrary distribution laser beam power profile. A 532-nm 0.5-W laser coupled to an optically addressed nematic liquid crystal spatial light modulator is used to generate a laser beam black-and-white high-resolution test line pattern having a 62.5-mu m linewidth. The test pattern is successfully profiled using a DMD formed 27.36 mu m x 27.36 mu m pinhole. Demonstrated for the first time is 2-D knife-edge DMD-based profiling of an ultraviolet 337-nm 4-ns pulsewidth 10-Hz pulsed laser beam.

Journal Title

Ieee Photonics Technology Letters

Volume

21

Issue/Number

9-12

Publication Date

1-1-2009

Document Type

Article

Language

English

First Page

666

Last Page

668

WOS Identifier

WOS:000267064600037

ISSN

1041-1135

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