Off-diagonal Mueller matrix elements in backscattering from highly diffusive media
Abbreviated Journal Title
J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
TARGET DETECTION; RANDOMLY ROUGH; POLARIZATION; SCATTERING; DEPOLARIZATION; SURFACES; Optics
Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface. (C) 2002 Optical Society of America.
Journal of the Optical Society of America a-Optics Image Science and Vision
"Off-diagonal Mueller matrix elements in backscattering from highly diffusive media" (2002). Faculty Bibliography 2000s. 3180.