Title

Atomic structure of Si-rich 3C-SiC(001)-(3x2): a photoelectron diffraction study

Authors

Authors

A. Tejeda; E. G. Michel; D. Dunham; P. Soukiassian; J. D. Denlinger; E. Rotenberg; Z. D. Hurych;B. Tonner

Comments

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Keywords

(3x2); ALSD; nanowire; PED; PhD; photoelectron diffraction; SiC; silicon; carbide; Si-rich; structure determination; TAADM; ENERGY ELECTRON-DIFFRACTION; X-RAY PHOTOELECTRON; BETA-SIC(100) SURFACE; AUGER-ELECTRON; CRYSTALLOGRAPHY; SCATTERING; LINES; Engineering, Electrical & Electronic; Materials Science, ; Multidisciplinary; Materials Science, Characterization & Testing; Optics

Abstract

The structure of the Si-rich 3C-SiC(001)-(3x2) surface reconstruction has been determined using x-ray photoelectron diffraction. The experimental results are only compatible with a modified version of the two-adlayer asymmetric dimer model. Other possible models can be discarded on the basis of our results.

Journal Title

Silicon Carbide and Related Materials - 2002

Volume

433-4

Publication Date

1-1-2002

Document Type

Article

Language

English

First Page

579

Last Page

582

WOS Identifier

WOS:000185077700139

ISSN

0255-5476

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