Title
FIB cross-sectioning of a single rapidly solidified hypereutectic Al-Si powder particle for HRTEM
Abbreviated Journal Title
Microsc. Res. Tech.
Keywords
AL-20SI ALLOY; MICROSTRUCTURE; COMPOSITES; FE; Anatomy & Morphology; Biology; Microscopy
Abstract
A creative technique of in-situ focused ion beam (FIB) extraction was introduced to prepare a gas atomized rapidly solidified hypereutectic Al-Si single particle's cross-section for High Resolution Transmission Electron Microscopy (HRTEM) analysis. This preparation technique may be employed to characterize very inimitable samples that are abnormally wrought or intricate to prepare through traditional techniques. TEM results revealed that a gas-atomization/rapid solidification process leads to a homogeneous dispersion of 50-100-nm Si phase in the Al matrix. Stacking faults and dislocations are observed in the microstructure and will ultimately lead to the increased strength in a resultant bulk material manufactured from this powder to be further examined. (c) 2005 Wiley-Liss. Inc.
Journal Title
Microscopy Research and Technique
Volume
66
Issue/Number
1
Publication Date
1-1-2005
Document Type
Article
DOI Link
Language
English
First Page
10
Last Page
16
WOS Identifier
ISSN
1059-910X
Recommended Citation
"FIB cross-sectioning of a single rapidly solidified hypereutectic Al-Si powder particle for HRTEM" (2005). Faculty Bibliography 2000s. 5577.
https://stars.library.ucf.edu/facultybib2000/5577
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu