Investigation of diode geometry and metal line pattern for robust ESD protection applications
Abbreviated Journal Title
Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
The effect of different diode geometries and metal patterns on the failure current It2 is investigated experimentally. The devices considered are N+/P well LOCOS diodes having different lengths, widths, finger numbers, and metal connections. The results provide useful insights into optimizing the diode for robust electrostatic discharge (ESD) protection applications. (C) 2008 Elsevier Ltd. All rights reserved.
"Investigation of diode geometry and metal line pattern for robust ESD protection applications" (2008). Faculty Bibliography 2000s. 610.