Novel silicon-controlled rectifier (SCR) for high-voltage electrostatic discharge (ESD) applications
Abbreviated Journal Title
IEEE Electron Device Lett.
electrostatic discharge (ESD); holding voltage; latchup immunity; transmission line pulsing (TLP); Engineering, Electrical & Electronic
Electrostatic discharge (ESD) protection, for high-voltage integrated circuits is challenging due to the requirement of high holding voltage to minimize the risk of ESD-induced latchup and electrical overstress. In this letter, a new silicon-controlled rectifier (SCR) is developed for this particular application. The SCR is designed based on the concept that the holding voltage can be increased by reducing the emitter injection efficiency in the SCR. This is accomplished by using a segmented emitter topology. Experimental data show that the new SCR can possess a holding voltage that is larger than 40 V and a failure current I(t2) that is higher than 28 mA/mu m.
Ieee Electron Device Letters
"Novel silicon-controlled rectifier (SCR) for high-voltage electrostatic discharge (ESD) applications" (2008). Faculty Bibliography 2000s. 638.