Title
Localized measurement of the optical thickness of a transparent window: application to the study of the photosensitivity of organic polymers
Abbreviated Journal Title
Appl. Optics
Keywords
LOW-COHERENCE INTERFEROMETRY; Optics
Abstract
The development of an optical setup that permits us to carry out high-resolution mappings of the absolute optical thickness of plane-parallel transparent windows is described. This measurement is based on the recording and processing of the spectral transmission of the wafer between 1520 and 1570 nm and has a relative precision better than 10(-6). Hence it is used for the characterization of the photosensitivity of two organic photopolymers (cationic ring opening polymer and poly(methylmethacrylate)). The refractive index change dynamics for both materials and the spontaneous evolution of the optical thickness are demonstrated. (C) 2006 Optical Society of America.
Journal Title
Applied Optics
Volume
45
Issue/Number
24
Publication Date
1-1-2006
Document Type
Article
Language
English
First Page
6099
Last Page
6105
WOS Identifier
ISSN
1559-128X
Recommended Citation
"Localized measurement of the optical thickness of a transparent window: application to the study of the photosensitivity of organic polymers" (2006). Faculty Bibliography 2000s. 6385.
https://stars.library.ucf.edu/facultybib2000/6385
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu