Title

In situ experimental study of a near-field lens at visible frequencies

Authors

Authors

G. Webb-Wood; A. Ghoshal;P. G. Kik

Comments

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Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

PERFECT-LENS; OPTICS; Physics, Applied

Abstract

Frequency dependent near-field scanning optical microscopy (NSOM) measurements of plasmon-mediated near-field focusing using a 50 nm thick Au film are presented. In these studies the tip aperture of a NSOM probe acts as a localized light source, while the near-field image formed by the metal lens is detected in situ using nanoscale scatterers placed in the image plane. By scanning the relative position of object and probe, the near-field image generated by the lens is resolved. NSOM scans performed at different illumination frequencies reveal an optimum near-field image quality at frequencies close to the surface plasmon resonance frequency.

Journal Title

Applied Physics Letters

Volume

89

Issue/Number

19

Publication Date

1-1-2006

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000241960400081

ISSN

0003-6951

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