Title

Group-index birefringence and loss measurements in silicon-on-insulator photonic wire waveguides

Authors

Authors

D. Duchesne; P. Cheben; R. Morandotti; B. Lamontagne; D. X. Xu; S. Janz;D. Christodoulides

Comments

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Abbreviated Journal Title

Opt. Eng.

Keywords

birefringence; linear loss; group index; effective index; nanowire; waveguides; silicon-on-insulator; dispersion; GROUP-VELOCITY DISPERSION; WAVELENGTH CONVERSION; RAMAN LASER; AMPLIFICATION; PROPAGATION; PULSES; Optics

Abstract

Group-index birefringence in silicon-on-insulator photonic wire waveguides is determined through a polarization beating technique and a Fabry-Perot resonance method. A large group-index birefringence, up to 0.67, is obtained as a result of the structural asymmetry and high field confinement of our waveguides. The group index and linear propagation loss are also determined. In particular, the group index is found to be as large as 4.45 due to the significant change in the effective mode index of the waveguide as a function of the wavelength. The effects of structure size on the measured losses and group indices are analyzed. Our experimental results are in good agreement with our simulations, and the method employed is found to be effective in analyzing the linear properties of submicrometer optical waveguide structures. (C) 2007 Society of Photo-Optical Instrumentation Engineers.

Journal Title

Optical Engineering

Volume

46

Issue/Number

10

Publication Date

1-1-2007

Document Type

Article

Language

English

First Page

7

WOS Identifier

WOS:000251549200022

ISSN

0091-3286

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