Title

Optical and morphological properties of MBE grown Wurtzite CdxZn1-xO thin films

Authors

Authors

J. W. Mares; F. R. Ruhge; A. V. Thompson; P. G. Kik; A. Osinsky; B. Hertog; A. M. Dabiran; P. P. Chow;W. V. Schoenfeld

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Opt. Mater.

Keywords

zinc oxide; cadmium zinc oxide; wide band gap; wurtzite oxides; CHEMICAL-VAPOR-DEPOSITION; BAND-GAP; YELLOW LUMINESCENCE; ZNO; MGXZN1-XO; TEMPERATURE; EPILAYERS; DEVICES; ALLOY; Materials Science, Multidisciplinary; Optics

Abstract

Wurtzite CdxZn1-xO epilayers with cadmium concentrations ranging from x = 0.02 to 0.30 were investigated using photolummescence, transmission/reflection spectroscopy, and atomic force microscopy. The CdxZn1-xO photoluminescence peak was found to shift through the visible region from 421 (2.95 eV) to 619 nm (2.0 eV) as the cadmium concentration was increased from 2% to 30%. An additional broad photoluminescence peak was observed and is attributed to deep levels-the center of the broad peak was found to shift from 675 to 750 nm as the cadmium concentration was increased. RMS roughness of the epilayers increased from 1.5 nm (x = 0.02) to 9.2 nm (x = 0.30), as determined from atomic force microscopy. The demonstrated visible wavelength tunability throughout the visible range verifies the viability of using wurtzite CdxZn1-xO compounds for visible light emission in future optoelectronic devices. (C) 2006 Elsevier B.V. All rights reserved.

Journal Title

Optical Materials

Volume

30

Issue/Number

2

Publication Date

1-1-2007

Document Type

Article

Language

English

First Page

346

Last Page

350

WOS Identifier

WOS:000250189300025

ISSN

0925-3467

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