Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy
Abbreviated Journal Title
IEEE Trans. Device Mater. Reliab.
atomic force microscopy; bias annealing; irradiation; MOS devices; reliability; HEAVY-ION IRRADIATION; INDUCED LEAKAGE CURRENT; GATE OXIDES; SIO2; CURRENTS; MOSFETS; Engineering, Electrical & Electronic; Physics, Applied
This paper investigated the reliability of thin silicon dioxide (SiO(2)) subjected to irradiation followed by stress, using conductive atomic force microscopy (C-AFM). The I-V characteristics of localized spots on thin oxide films were measured before and after Co(60) gamma-ray irradiation. The oxide films were then subjected to a ramped voltage stress simultaneously during the I-V measurements. By taking advantage of a small contact area, we report for the first time the nanoscale postirradiation bias-annealing effect in thin S film using C-AFM. Based on SiO(2) the number of fluctuating current peaks appearing in the I-V curves of the pre- and posttreatment oxide films, as well as the calculated effective barrier height from the Fowler-Nordheim tunneling theory, we found that the trapped charge in the oxide films, but not the charge at the interface caused by Co(60) gamma-ray irradiation, can be effectively annealed out by a postirradiation ramped voltage.
Ieee Transactions on Device and Materials Reliability
"Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy" (2007). Faculty Bibliography 2000s. 7803.