Title

Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb

Authors

Authors

M. Akbulut; J. Davila-Rodriguez; I. Ozdur; F. Quinlan; S. Ozharar; N. Hoghooghi;P. J. Delfyett

Comments

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Abbreviated Journal Title

Opt. Express

Keywords

WAVE-FORM GENERATION; LASER; PRECISION; Optics

Abstract

We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be similar to 1.47 GHz for the particular etalon that was used. (C) 2011 Optical Society of America

Journal Title

Optics Express

Volume

19

Issue/Number

18

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

16851

Last Page

16865

WOS Identifier

WOS:000294489700013

ISSN

1094-4087

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