Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb
Abbreviated Journal Title
WAVE-FORM GENERATION; LASER; PRECISION; Optics
We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be similar to 1.47 GHz for the particular etalon that was used. (C) 2011 Optical Society of America
"Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb" (2011). Faculty Bibliography 2010s. 1044.