Optical-force-induced artifacts in scanning probe microscopy
Abbreviated Journal Title
RESOLUTION; MODE; Optics
In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps. (C) 2011 Optical Society of America
"Optical-force-induced artifacts in scanning probe microscopy" (2011). Faculty Bibliography 2010s. 1491.