Abbreviated Journal Title
J. Appl. Phys.
Keywords
ZINC-OXIDE; THIN-FILMS; PHOSPHORUS; Physics, Applied
Abstract
In this work, we explore the minority carrier diffusion length in zinc oxide nanowires, using the electron beam-induced current technique. Systematic measurements as a function of temperature were performed on p-type, Sb-doped ZnO film, containing a 4 mu m thick nanowire layer. The minority carrier diffusion length exhibits a thermally activated increase with the energy of 74 +/- 5 meV. Electron beam irradiation also causes the diffusion length increase with the activation energy of 247 +/- 10 meV, likely related to Sb(Zn)-2V(Zn) acceptor-complex.
Journal Title
Journal of Applied Physics
Volume
109
Issue/Number
1
Publication Date
1-1-2011
Document Type
Article
DOI Link
Language
English
First Page
3
WOS Identifier
ISSN
0021-8979
Recommended Citation
Lin, Y.; Shatkhin, M.; Flitsiyan, E.; Chernyak, L.; Dashevsky, Z.; Chu, S.; and Liu, J. L., "Minority carrier transport in p-ZnO nanowires" (2011). Faculty Bibliography 2010s. 1565.
https://stars.library.ucf.edu/facultybib2010/1565
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu