Precise, real-time, single-shot carrier-envelope phase measurement in the multi-cycle regime
Abbreviated Journal Title
Appl. Phys. Lett.
ABOVE-THRESHOLD IONIZATION; CYCLE LASER-PULSES; FIELDS; Physics, Applied
Polarization gating is used to extend a real-time, single-shot, carrier-envelope phase (CEP) measurement, based on high-energy above-threshold ionization in xenon, to the multi-cycle regime. The single-shot CEP precisions achieved are better than 175 and 350 mrad for pulse durations up to 10 fs and 12.5 fs, respectively, while only 130 mu J of pulse energy are required. This opens the door to study and control of CEP-dependent phenomena in ultra-intense laser-matter interaction using optical parametric chirped pulse amplifier based tera- and petawatt class lasers. (C) 2011 American Institute of Physics. [doi:10.1063/1.3641472]
Applied Physics Letters
"Precise, real-time, single-shot carrier-envelope phase measurement in the multi-cycle regime" (2011). Faculty Bibliography 2010s. 1680.