Title

Precise, real-time, single-shot carrier-envelope phase measurement in the multi-cycle regime

Authors

Authors

M. Moller; A. M. Sayler; T. Rathje; M. Chini; Z. H. Chang;G. G. Paulus

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

ABOVE-THRESHOLD IONIZATION; CYCLE LASER-PULSES; FIELDS; Physics, Applied

Abstract

Polarization gating is used to extend a real-time, single-shot, carrier-envelope phase (CEP) measurement, based on high-energy above-threshold ionization in xenon, to the multi-cycle regime. The single-shot CEP precisions achieved are better than 175 and 350 mrad for pulse durations up to 10 fs and 12.5 fs, respectively, while only 130 mu J of pulse energy are required. This opens the door to study and control of CEP-dependent phenomena in ultra-intense laser-matter interaction using optical parametric chirped pulse amplifier based tera- and petawatt class lasers. (C) 2011 American Institute of Physics. [doi:10.1063/1.3641472]

Journal Title

Applied Physics Letters

Volume

99

Issue/Number

12

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000295853500008

ISSN

0003-6951

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