Title

Modeling of light scattering in different regimes of surface roughness

Authors

Authors

S. Schroder; A. Duparre; L. Coriand; A. Tunnermann; D. H. Penalver;J. E. Harvey

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Opt. Express

Keywords

OPTICAL-PERFORMANCE; FINISH; Optics

Abstract

The light scattering of rough metallic surfaces with roughness levels ranging from a few to several hundred nanometers is modeled and compared to experimental data. Different modeling approaches such as the classical Rayleigh-Rice vector perturbation theory and the new Generalized Harvey-Shack theory are used and critically assessed with respect to ranges of validity, accuracy, and practicability. Based on theoretical calculations and comparisons with Rigorous Coupled Wave Analysis for sinusoidal phase gratings, it is demonstrated that the approximate scatter models yield surprisingly accurate results and at the same time provide insight into light scattering phenomena. For stochastically rough metal surfaces, the predicted angles resolved scattering is compared to experimental results at 325 nm, 532 nm, and 1064 nm. In addition, the possibilities of retrieving roughness information from measured scattering data for different roughness regimes are discussed. (C) 2011 Optical Society of America

Journal Title

Optics Express

Volume

19

Issue/Number

10

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

9820

Last Page

9835

WOS Identifier

WOS:000290490200105

ISSN

1094-4087

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