Title

Image degradation due to surface scatter in the presence of aberrations

Authors

Authors

N. Choi;J. E. Harvey

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Appl. Optics

Keywords

SYSTEMS; SIMULATION; Optics

Abstract

Image analysis in the presence of surface scatter due to residual optical fabrication errors is often perceived to be complicated, nonintuitive, and achieved only by computationally intensive nonsequential ray tracing with commercial optical analysis codes such as ASAP, Zemax, Code V, TracePro, or FRED. However, we show that surface scatter can be treated very similarly to conventional wavefront aberrations. For multielement imaging systems degraded by both surface scatter and aberrations, the composite point spread function is obtained in explicit analytic form in terms of convolutions of the geometrical point spread function and scaled bidirectional scattering distribution functions of the individual surfaces of the imaging system. The approximations and assumptions in this formulation are discussed, and the result is compared to the irradiance distribution obtained using commercial software for the case of a two-mirror telescope operating at an extreme ultraviolet wavelength. The two results are virtually identical. (C) 2012 Optical Society of America

Journal Title

Applied Optics

Volume

51

Issue/Number

5

Publication Date

1-1-2012

Document Type

Article

Language

English

First Page

535

Last Page

546

WOS Identifier

WOS:000300605300004

ISSN

1559-128X

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