Title

Metrics, Metrics, Metrics, Part 2: Universal Metrics?

Authors

Authors

R. R. Hoffman; P. A. Hancock;J. M. Bradshaw

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

IEEE Intell. Syst.

Keywords

Computer Science, Artificial Intelligence; Engineering, Electrical &; Electronic

Journal Title

Ieee Intelligent Systems

Volume

25

Issue/Number

6

Publication Date

1-1-2010

Document Type

Article

Language

English

First Page

93

Last Page

97

WOS Identifier

WOS:000285280200016

ISSN

1541-1672

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