Discrimination of field components in optical probe microscopy
Abbreviated Journal Title
We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity. (c) 2012 Optical Society of America
"Discrimination of field components in optical probe microscopy" (2012). Faculty Bibliography 2010s. 2875.