Authors

D. Joung; A. Chunder; L. Zhai;S. I. Khondaker

Comments

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“This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in the linked citation and may be found originally at Applied Physics Letters.

Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

ELECTRICAL-CONDUCTIVITY; TRANSPARENT; SINGLE; FILMS; Physics, Applied

Abstract

We elucidate on the low mobility and charge traps of the chemically reduced graphene oxide (RGO) sheets by measuring and analyzing temperature dependent current-voltage characteristics. The RGO sheets were assembled between source and drain electrodes via dielectrophoresis. At low bias voltage the conduction is Ohmic while at high bias voltage and low temperatures the conduction becomes space charge limited with an exponential distribution of traps. We estimate an average trap density of 1.75 x 10(16) cm(-3). Quantitative information about charge traps will help develop optimization strategies of passivating defects in order to fabricate high quality solution processed graphene devices.

Journal Title

Applied Physics Letters

Volume

97

Issue/Number

9

Publication Date

1-1-2010

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000282187200056

ISSN

0003-6951

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