RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments
Abbreviated Journal Title
INTERFACE-TRAP GENERATION; HOT-CARRIER DEGRADATION; LOW-FREQUENCY NOISE; TRANSFORMER-FEEDBACK; MOS-TRANSISTORS; SOFT BREAKDOWN; PERFORMANCE; MOSFETS; TECHNOLOGY; AMPLIFIERS; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
A current reused LC voltage-controlled oscillator (VCO) operating at 2.4 GHz range has been designed and fabricated. The measured output current, phase noise, and oscillation frequency after RF stress show significant parameter shifts from their fresh circuit condition. Impact of hot carrier effect and negative bias temperature instability on the VCO's phase noise is discussed. (C) 2012 Elsevier Ltd. All rights reserved.
"RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments" (2012). Faculty Bibliography 2010s. 3534.