A Portable High-Resolution Surface Measurement Device
Abbreviated Journal Title
IEEE Trans. Instrum. Meas.
Aerospace engineering; ergonomics; optical sensors; sensor systems; CONFOCAL MICROSCOPY; Engineering, Electrical & Electronic; Instruments & Instrumentation
A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects.
Ieee Transactions on Instrumentation and Measurement
"A Portable High-Resolution Surface Measurement Device" (2013). Faculty Bibliography 2010s. 4137.