Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths
Abbreviated Journal Title
J. Appl. Phys.
REFLECTARRAY ANTENNA; OPTICAL MICROSCOPY; DESIGN; SCATTERING; NANOPARTICLE; REFLECTION; AMPLITUDE; ELEMENTS; ENERGY; TIP; Physics, Applied
Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
Journal of Applied Physics
"Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths" (2014). Faculty Bibliography 2010s. 6196.