Authors

F. Khalilzadeh-Rezaie; C. W. Smith; J. Nath; N. Nader; M. Shahzad; J. W. Cleary; I. Avrutsky;R. E. Peale

Comments

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Abbreviated Journal Title

J. Nanophotonics

Keywords

bismuth; infrared; surface polariton; grating coupler; semimetal; specular reflectance; scattering matrix analysis; THIN-FILMS; DOPED SILICON; PLASMONICS; SILICIDES; ANTIMONY; Nanoscience & Nanotechnology; Optics

Abstract

Optical constants for evaporated bismuth (Bi) films were measured by ellipsometry and compared with those published for single crystal and melt-cast polycrystalline Bi in the wavelength range of 1 to 40 mu m. The bulk plasma frequency omega(p) and high-frequency limit to the permittivity epsilon(infinity) were determined from the long-wave portion of the permittivity spectrum, taking previously published values for the relaxation time tau and effective mass m*. This part of the complex permittivity spectrum was confirmed by comparing calculated and measured reflectivity spectra in the far-infrared. Properties of surface polaritons (SPs) in the long-wave infrared were calculated to evaluate the potential of Bi for applications in infrared plasmonics. Measured excitation resonances for SPs on Bi lamellar gratings agree well with calculated resonance spectra based on grating geometry and complex permittivity.

Journal Title

Journal of Nanophotonics

Volume

9

Publication Date

1-1-2015

Document Type

Article

Language

English

First Page

12

WOS Identifier

WOS:000350469900001

ISSN

1934-2608

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