Title

Controlled electroplating and electromigration in nickel electrodes for nanogap formation

Authors

Authors

L. Valladares; L. L. Felix; A. B. Dominguez; T. Mitrelias; F. Sfigakis; S. I. Khondaker; C. H. W. Barnes;Y. Majima

Comments

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Abbreviated Journal Title

Nanotechnology

Keywords

NANOMETER-SPACED ELECTRODES; ATOMIC-SIZE CONTACTS; BALLISTIC; MAGNETORESISTANCE; CONDUCTANCE QUANTIZATION; ROOM-TEMPERATURE; METALLIC; ELECTRODES; QUANTUM CONDUCTANCE; GOLD NANOPARTICLES; NI NANOCONTACTS; POINT CONTACTS; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied

Abstract

We report the fabrication of nickel nanospaced electrodes by electroplating and electromigration for nanoelectronic devices. Using a conventional electrochemical cell, nanogaps can be obtained by controlling the plating time alone and after a careful optimization of electrodeposition parameters such as electrolyte bath, applied potential, cleaning, etc. During the process, the gap width decreases exponentially with time until the electrode gaps are completely bridged. Once the bridge is formed, the ex situ electromigration technique can reopen the nanogap. When the gap is similar to 1 nm, tunneling current-voltage characterization shows asymmetry which can be corrected by an external magnetic field. This suggests that charge transfer in the nickel electrodes depends on the orientation of magnetic moments.

Journal Title

Nanotechnology

Volume

21

Issue/Number

44

Publication Date

1-1-2010

Document Type

Article

Language

English

First Page

8

WOS Identifier

WOS:000282679800009

ISSN

0957-4484

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