Modeling the Complex Refractive Index of CdxZn1-xo by Spectrophotometric Characterization: An Evolutionary Approach

Abstract

The complex refractive index is reported at room temperature for CdxZn1_xO thin film alloys for Cd composition up to 0.16. The CdxZn1_xO epilayers were grown by molecular-beam epitaxy on smooth ZnO/GaN/sapphire lattice templates. Transmission spectra were recorded by spectrophotometry in the 350-800nm wavelength range. The refractive index and extinction coefficient were derived by an evolutionary algorithm, which optimizes the Sellmeier and Forouhi-Bloomer dispersion models by a least-squares fitting to the experimental data.

Notes

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Thesis Completion

2007

Semester

Summer

Advisor

Schoenfeld, Winston

Degree

Bachelor of Science (B.S.)

College

College of Engineering and Computer Science

Degree Program

Electrical Engineering

Subjects

Dissertations, Academic -- Engineering and Computer Science; Engineering and Computer Science -- Dissertations, Academic

Format

Print

Identifier

DP0022138

Language

English

Access Status

Open Access

Length of Campus-only Access

None

Document Type

Honors in the Major Thesis

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