A dual beam low coherence interferometer with improved signal to noise ratio. The interferometer directs both a collimated beam about a focused beam to a target. A detector detects the multiscattering from the target with a splitter where a reference arm with matched mirrors allows for measuring both the intensity and magnitude values of the beam to be measured. The intensity and magnitude values indicate the imaging of the target in applications such as OCT(optical coherence tomography) having medical imaging applications, while improving the signal to noise ratios. Other applications include material characterization in ceramics, composites and other granular material. Additionally, the interferometer can be used to image target defects such as inclusions, voids, cracks, and the like, in ceramics and other materials which scatter light.
Application Serial Number
Assignee at Issuance
College of Optics and Photonics
Assignee at Filing
Nonprovisional Application Record
Dogariu, Aristide, "Duel Beam Low Coherence Interferometer with Improved Signal to Noise Ratio" (2001). UCF Patents. 136.