An agile optical sensor based on spectrally agile heterodyne optical interferometric confocal microscopy implemented via an ultra-stable in-line acousto-optic tunable filter (AOTF) based interferometer using double anisotropic acousto-optic Bragg diffraction. One embodiment uses a tunable laser as the light source while other embodiments use a broadband source or a fixed wavelength laser as the source. One embodiment uses anisotropic diffractions in an AOTF to generate two near-collinear orthogonal linear polarization and slightly displaced beams that both pass via a test sample to deliver highly sensitive sample birefringence or material optical retardation measurements. A spherical lens is used to form focused spots for high resolution spatial sampling of the test object. The laser and AOTF tuning allows birefringence measurements taken at different wavelengths, one at a time. An alternate embodiment makes use of anisotropic diffractions in an acousto-optic deflector or Bragg cell in
Application Serial Number
Joint Assignment w/UCFRF: NUSENSORS, Inc.
Assignee at Issuance
Joint Assignment w/UCFRF: Nuonics, Inc.
College of Optics and Photonics
Assignee at Filing
Agency: Nuonics, Inc.
Nonprovisional Application Record
Riza, Nabeel; Bokhari, Amana; and Perez, Frank, "Agile Spectral Interferometric Microscopy" (2007). UCF Patents. 17.