An easy and controllable method and system to attach a carbon nanotube to a scanning probe tip such as a scanning probe microscopy (SPM) tip using a focus ion beam (FIB) technique. The method and system includes selecting a carbon fiber by a Focus Ion Beam micromanipulator, picking up the carbon fiber with the nanotube tip, forming a slot on an SPM tip, and inserting the carbon fiber with the nanotube tip into the slot.
Application Serial Number
Assignee at Issuance
College of Sciences
Assignee at Filing
Nonprovisional Application Record
Chow, Lee and Chai, Guang, "Method and System to Attach Carbon Nanotube Probe to Scanning Probe Microscopy Tips" (2010). UCF Patents. 331.