Abstract

The disclosure relates to measuring devices that are particularly suited for the purpose of in-situ characterization of particles present in fluid substances or in air using a low-coherence interferometer. Specifically, the characterization includes average size, size distribution, volumetric density, and composition. The low-coherence interferometer utilizes a split band of radiation to illuminate a sample probe and a reference probe then combines the reflected radiation from both probes to determine the photon pathlength distribution of the tested particulate or colloidal containing stream and from this information determine the size characteristics of said stream. The methodology is relevant to possible spatially distributed control of chemical processes such as emulsion polymerization to produce paints, coatings, synthetic rubbers, or crystallization processes in pharmaceuticals, food, and bulk chemicals industries. Another application relates to on-line control of particle size an

Document Type

Patent

Patent Number

US 6,738,144

Application Serial Number

09/465,586

Issue Date

5-18-2004

Current Assignee

UCFRF

Assignee at Issuance

UCFRF

College

College of Optics and Photonics

Department

CREOL

Allowance Date

2-11-2004

Filing Date

12-17-1999

Assignee at Filing

UCFRF

Filing Type

Nonprovisional Application Record

Donated

no

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