A differential curvature sensing device for measuring a wavefiont curvature by employing increased spatial sampling for wavefront testing with mid-frequency error recovery. The device includes a sampling sensor having an output beam, an optical element to split said output beam, a lenslet array in the path of each beam to generate corresponding sampling grids, a shearing element for shifting the grid points in horizontal and vertical directions to produce plural sampling grids having plural grid points for use generating a spatial sampling grid having a density for mid-spatial frequency recovery. The displacement of the shifting less than a pitch size of the lenslet array, and a measuring device measuring plural slopes of plural wavefronts at each grid point to obtain a wavefront normal curvature and corresponding twist curvature terms to determine a principal curvature and directions. The sensor is a Shack-Hartman sensor, shearing interferometer sensor and other discrete-point sampli
US 7,619,191 B1
Application Serial Number
Assignee at Issuance
College of Optics and Photonics
Assignee at Filing
Nonprovisional Application Record
Rolland, Jannick and Zou, Weiyao, "Increase Spatial Sampling For Wave Front Mid-Spatial Frequency Error Recovery" (2009). UCF Patents. 681.