Three dimensional reconstruction metrology by combinatory multiple parameter characterization and scanning probe microscopy
Measurement, Scanning electron microscopy, Scanning probe microscopy
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Master of Science (M.S.)
College of Engineering and Computer Science
Mechanical, Materials, and Aerospace Engineering
Materials Science and Engineering
Length of Campus-only Access
Masters Thesis (Open Access)
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
Houge, Eric C., "Three dimensional reconstruction metrology by combinatory multiple parameter characterization and scanning probe microscopy" (2001). Retrospective Theses and Dissertations. 1209.