Investigation of variables affecting focused ion beam milling as applied to specimen preparation for electron microscopy : a correlation between montecarlo based simulation and empirical observation

Author

Brenda I. Prenitzer, University of Central Florida

Keywords

Transmission electron microscopy

Notes

This item is only available in print in the UCF Libraries. If this is your thesis or dissertation, you can help us make it available online for use by researchers around the world by downloading and filling out the Internet Distribution Consent Agreement. You may also contact the project coordinator Kerri Bottorff for more information.

Graduation Date

1999

Semester

Spring

Advisor

Giannuzzi, Lucille A.

Degree

Doctor of Philosophy (Ph.D.)

College

College of Engineering

Department

Mechanical, Materials, and Aerospace Engineering

Format

Print

Language

English

Length of Campus-only Access

None

Access Status

Doctoral Dissertation (Open Access)

Subjects

Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic

STARS Citation

Prenitzer, Brenda I., "Investigation of variables affecting focused ion beam milling as applied to specimen preparation for electron microscopy : a correlation between montecarlo based simulation and empirical observation" (1999). Retrospective Theses and Dissertations. 2233.
https://stars.library.ucf.edu/rtd/2233