Keywords

Integrated circuits -- Design and construction, Integrated circuits -- Large scale integration

Abstract

There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Array, Standard Cell, and Full Custom. The objective of this research is to design a VLSI circuit using the Standard Cell approach. A prime requisite for a successful design of these circuits is an integrated Computer Aided Design (CAD) system. The chip design requirements for an integrated CAD system are developed and their interrelationships are presented. As VLSI circuits grow in complexity, the problem of how to test them becomes more difficult. Two methods for testing are defined: 1. Insertion within the system of which the chip is a part, and use of standard system test techniques. 2. Self-test circuitry built into the chip. These testing techniques were used in the VLSI circuit in this report.

Notes

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Graduation Date

1984

Advisor

Simons, Fred O.

Degree

Master of Science (M.S.)

College

College of Engineering

Degree Program

Engineering

Format

PDF

Pages

42 p.

Language

English

Rights

Public Domain

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0015926

Included in

Engineering Commons

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