Keywords

Electromagnetic waves -- Scattering

Abstract

This was a study to measure surface roughness using scattering of electromagnetic waves in the Ka and X microwave frequency bands. The detected fluctuations of the reflected field intensity is a measure of surface roughness. The reflected field intensity depends on the wavelength, the angle of incidence and the electrical properties of the media. Since the surface presents irregularities with randomly distributed facets, the characteristics of the rough-surface reflected wave can only be described by the statistical properties of the field intensity. The dependence of the normalized moments of the returned scatter on distance from the rough surface to the receiving antenna was analyzed as a function of surface roughness distribution at two different frequency-bands.

Notes

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Graduation Date

Spring 1980

Advisor

Phillips, Ronald L.

Degree

Master of Science (M.S.)

College

College of Engineering

Format

PDF

Pages

49 p.

Language

English

Rights

Public Domain

Length of Campus-only Access

None

Access Status

Masters Thesis (Open Access)

Identifier

DP0013296

Included in

Engineering Commons

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