Pattern recognition systems, Random access memory
Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.
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Linton, Darrell G.
Master of Science (M.S.)
College of Engineering
Length of Campus-only Access
Masters Thesis (Open Access)
Subrin, Richard I., "An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories" (1981). Retrospective Theses and Dissertations. 596.