An in-house reflectometer/interferometer has been built to investigate the varying curvature and thickness profiles in the contact line region of air, acetone, iso-octane, ethanol, and water on various types of substrates. Light intensity measurements were obtained using our reflectometer/interferomter and then analyzed in MATLAB to produce thickness and curvature profiles. The apparatus is based on the principle of a reflectometer, consisting of different optical elements, probe, light source, and spectrometer. Our reflectometer/interferomter takes measurements in the UV-Vis-IR range (200nm-1000nm). This range is achieved by using a light source that has both a deuterium light (190nm-800nm), a tungsten halogen light (400nm-1100nm), a Metal-Core Printed Circuit Board LED (800nm-1000nm) and a Metal-Core Printed Circuit board cold white LED (400nm-800nm, 6500 K). A UV-VIS-IR spectrometer reads the light response after light is focused on the region of interest. Then a CCD camera (2448x2048) records the profiles for image analyzing interferometry. The readings were then validated based on results in the literature and studies with cylindrical lens samples.
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Master of Science in Aerospace Engineering (M.S.A.E.)
College of Engineering and Computer Science
Mechanical and Aerospace Engineering
Aerospace Engineering; Thermofluid Aerodynamic Systems
Length of Campus-only Access
Masters Thesis (Open Access)
Arends-Rodriguez, Armando, "Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements" (2017). Electronic Theses and Dissertations, 2004-2019. 5440.