Title

1/F Optimization For A Complementary Metal-Oxide Semiconductor Focal Plane Array Input Circuit

Comments

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Abbreviated Journal Title

Am. Sch.

Keywords

Optics

Abstract

In electro-optical detector systems, the noise characteristics of transresistance amplifiers are sensitive to the incremental conductivity of the photovoltaic detector. In this paper we show that the 1/f noise corner frequency contributed to the noise by the amplifier is a function of the bias applied to the detector. The 1/f noise corner frequency of the diode in cooled focal plane arrays is also a function of the reverse bias, but there is an optimum reverse bias that is not 0 V. This fact becomes important when it is necessary to use complementary metal oxide semiconductor amplifiers that have lame 1/f noise corner frequencies.

Journal Title

American Scholar

Volume

27

Issue/Number

3

Publication Date

1-1-1988

Document Type

Article

Language

English

First Page

246

Last Page

249

WOS Identifier

WOS:A1988M499800015/a>

ISSN

0091-3286

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