Optics; Physics; Atomic; Molecular & Chemical
Photoionization cross sections (σ) and photoelectron angular distribution parameters (β) across the (ns’,nd’) autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 Å by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns’ resonances.
Physical Review A
Wu, Jian Z.; Whitfield, Scott B.; Caldwell, C. Denise; Krause, Manfred O.; Van der Meulen, Peter; and Fahlman, Anders, "High-Resolution Photoelectron Spectrometry Of Selected Ns' And Nd' Autoionization Resonances In Ar, Kr, And Xe" (1990). Faculty Bibliography 1990s. 187.