A study of the validity of capacitance-based method for extracting the effective channel length of MOSFET's
Abbreviated Journal Title
IEEE Trans. Electron Devices
SERIES RESISTANCE; LDD MOSFETS; Engineering, Electrical & Electronic; Physics, Applied
The capacitance-based method (C-V method) is a straightforward method for extracting the effective channel length of MOSFET's. This paper investigates the validity of such a method based on results simulated from a two-dimensional (2-D) device simulator. Thr effective channel length extracted from the C-V method is also compared with those obtained from other methods reported in the literature.
Ieee Transactions on Electron Devices
"A study of the validity of capacitance-based method for extracting the effective channel length of MOSFET's" (1997). Faculty Bibliography 1990s. 1974.