Electrostatic discharge in semiconductor devices: An overview
Abbreviated Journal Title
electrical overstress; electrostatic discharge; empirical models; failure mechanisms; semiconductor devices; CMOS INTEGRATED-CIRCUITS; BASE BIAS STRESS; PROTECTION TECHNIQUES; FAILURE; ESD; RELIABILITY; DEGRADATION; MECHANISMS; BREAKDOWN; PULSES; Engineering, Electrical & Electronic
Electrostatic discharge (ESD) is an event that sends current through an integrated circuit (IC). This paper reviews the impact of ESD on the IC industry and details the four stages of an ESD event: 1) charge generation, 2) charge transfer, 3) device response, and 4) device failure. Topics reviewed are charge generation mechanisms, models for ESD charge transfer electrical conduction mechanisms, and device damage mechanisms leading to circuit failure.
Proceedings of the Ieee
"Electrostatic discharge in semiconductor devices: An overview" (1998). Faculty Bibliography 1990s. 2485.