Authors

J. J. Bruckner; K. Wozniak; S. Hardcastle; A. Sklyarov; S. Seal;T. L. Barr

Comments

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Abbreviated Journal Title

J. Vac. Sci. Technol. A-Vac. Surf. Films

Keywords

SOLID-STATE NMR; X-RAY-DIFFRACTION; IONIC COMPLEXES; 1, 2-DICHLOROMALEIC; ACID; PROTON SPONGES; 1, 8-BIS(DIMETHYLAMINO)NAPHTHALENE; ESCA; HYDROGEN; H-1; Materials Science, Coatings & Films; Physics, Applied

Abstract

A novel form of ultrahigh vacuum (UHV) cryogenic stabilization has been used to obtain high-resolution x-ray photoelectron - spectroscopy (XPS) data from a complex amine, 1,8-bis(dimethylamino) naphthalene, whose solid phase exhibited at room temperature an unacceptably high rate of sublimation. Protonated versions of the amine exhibit hydrogen bonding. Electron spectroscopy for chemical analysis chemical shifts can be used to describe the strength and asymmetry of hydrogen bonding formed in proton sponge complexes. Analyzing the binding energy shifts of N (1s) induced by the presence of this hydrogen bonding required obtaining corresponding XPS spectra from the nonprotonated (reference) sample, but the reference sample sublimes under even moderate vacuum conditions. The combined results suggest that other high vapor pressure materials, particularly those that were previously considered to be too corrosive for routine analysis, can be cryogenically stabilized for surface analysis under similar UHV conditions. (C) 1999 American Vacuum Society. [S0734-2101(99)09605-0].

Journal Title

Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films

Volume

17

Issue/Number

5

Publication Date

1-1-1999

Document Type

Article

Language

English

First Page

2668

Last Page

2675

WOS Identifier

WOS:000082596600038

ISSN

0734-2101

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