Title

Fractal roughness retrieval by integrated wavelet transform

Authors

Authors

A. Dogariu; G. Boreman; J. Uozumi;T. Asakura

Comments

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Abbreviated Journal Title

Opt. Rev.

Keywords

integrated wavelet transform; rough surface; fractal surface; self-similar surface; self-affine surface; autocorrelation; scaling; exponent; X-RAY-SCATTERING; SURFACE; SEA; Optics

Abstract

An integrated-wavelet-transform (IWT) approach is proposed for the study of scattering from slightly rough surfaces that manifest scaling properties over a finite domain of correlation lengths. Instead of collecting angle-resolved intensities, values of the irradiance integrated over increasing areas are used to enhance the contributions of small irradiances at large scattering angles and to reduce the coherent noise. In the case of self-similar surfaces, the scaling behavior of IWT allows investigation of the surface roughness at various length scales. For the realistic case of self-affine surfaces, IWT permits the evaluation of the scaling exponent of the autocorrelation and also offers a direct way to evaluate the necessary length scale of the surface profile.

Journal Title

Optical Review

Volume

6

Issue/Number

4

Publication Date

1-1-1999

Document Type

Article

Language

English

First Page

293

Last Page

301

WOS Identifier

WOS:000083301300004

ISSN

1340-6000

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