Modeling and measurement approaches for electrostatic discharge in semiconductor devices and ICs: an overview
Abbreviated Journal Title
Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
Electrostatic charges can be generated everywhere. When they are discharged through semiconductor devices and integrated circuits, an event called an electrostatic discharge (ESD), failure of electronics systems using these devices and ICs can occur. This paper first gives an overview of the ESD sources and models. Then the emphasis is placed on the modeling and measurements of the most commonly used of these models caned the human body model (HBM). Various HBM protection circuits are examined to look at ways of preventing ICs from being damaged should ESD events occur. The issue of HBM measurements is also addressed so that the rapid transient associated with this ESD model can be accurately measured and characterized. (C) 1999 Elsevier Science Ltd. All rights reserved.
"Modeling and measurement approaches for electrostatic discharge in semiconductor devices and ICs: an overview" (1999). Faculty Bibliography 1990s. 2710.